生活也可以有系統
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AOI – Auto optical inspection
LED PSS defect inspection in Force instrument
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Paper- Advanced servo control
Advanced control theory development and paper published in IET control theory and application
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AFM – Atom Force Microscope
AFM(atom force microscope). Capable to measure surface profile in Nano meter (0.000000001mm) An Atomic Force Microscope (AFM) is a complex piece of equipment that consists of several key components: Probe: This is the most crucial part of an AFM. The probe consists of a very sharp tip (often only a few atoms wide) that is…
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Strengths
System integration on measurement and control system with productionRich experience on system integration including software, mechanical, date/signal communication, and how to use it on process.Capable to build up measurement and control system from 0 – ex: building up process tools from concept to migration and combine with control system including all hand-over document and coordinate…
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About me
Hi, I am Rishen Lu. You can call me David as well. It is my first website to introduce myself and try to record something i can do here. I am being inspired by my wife, Kaki who create her own website cckaki.com and try to have her own business. Everything is just starting and…
Got any book recommendations?