CV

Rishen Lu
Project manager, measurement and control system integrator
Hello, I’m Rishen Lu. . I Have more than 10 years of experience in instruments design. Especially for Display and semiconductor
A LITTLE ABOUT ME
.
BIRTHDAY
June,  19, 1982
ADDRESS
Taichung, Taiwan(ROC)
EMAIL
Rishen.lu@gmail.com
WHAT I
LOVE TO DO

Integration

System integration including Mechanical, Software, Servo control, PLC, auto report system to make idea real

DEVELOPMENT

Rich experience on measurement and control system development, Love to face new challenge and request to develop tools for it

Project

Wide networking and capable to lead cross-functional team for complicated task 
MY
EDUCATION
2000 – 2004
National Tsing-Hua University, 
Major  in Power machine engineering
2004 – 2006
National Tsing-Hua University.
Master. Major in Electric control system
MY
EXPERIENCE
2012-PRESENT
Project manager, WW measurement and control technology in 
Corning Display 
Measurement and control technology roadmap developing in display.
Global team management and Asia team building up
2009-2012
Project manager in 
Force instrument 

Startup company from Academia Sinica.

Nano spec measure instruments design from zero, including AFM/SPM, profilometer, Lock-in amplifier, nano XY stage, and AOI for PSS(PATTERN SAPPHIRE SUBSTRATE).

2006-2008
Auto control engineer
FOXCONN Inc.
Robot motion control
Robot cell design for auto defect checking and packing

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  1. Use ChatGPT for quick research on specific project-related topics.
  2. Use ChatGPT to automate responses to frequently asked questions or send reminders to team members.
  3. Use ChatGPT to schedule meetings and set reminders for deadlines.
  4. Use ChatGPT to manage tasks, track progress and stay organized.

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These chatbot platforms offer a range of features and integrations that can help you improve your communication and collaboration with your team, ultimately leading to increased work efficiency as a project manager.

Design for different sample request. Resolution can achieve Nano meter. 100% design including HW and SW in Force inc.

LED PSS defect inspection in Force instrument

Advanced control theory development and paper published in IET control theory and application

AFM(atom force microscope). Capable to measure surface profile in Nano meter (0.000000001mm)

An Atomic Force Microscope (AFM) is a complex piece of equipment that consists of several key components:

  1. Probe: This is the most crucial part of an AFM. The probe consists of a very sharp tip (often only a few atoms wide) that is attached to a cantilever. The probe is used to scan the surface of the sample.
  2. Cantilever: The cantilever is a thin beam attached at one end to the probe. When the probe scans the surface of the sample, forces between the atoms cause the cantilever to bend or deflect.
  3. Laser: A laser beam is directed onto the back of the cantilever. As the cantilever bends or deflects due to the atomic forces, the direction of the reflected laser beam changes.
  4. Photodetector: This component detects the changes in the direction of the reflected laser beam. The photodetector is divided into four quadrants, and the difference in light intensity between these quadrants allows the deflection of the cantilever to be measured.
  5. XYZ Piezoelectric Scanner: This component moves the sample (or sometimes the probe) in the X, Y, and Z directions with extreme precision, allowing the probe to scan the surface of the sample.
  6. Feedback Loop: This electronic system controls the height of the scanner (or the probe) to maintain constant force between the probe and the sample, or constant deflection of the cantilever.
  7. Controller: This is the ‘brain’ of the AFM. It processes the signals from the photodetector and controls the XYZ scanner via the feedback loop.
  8. Sample Stage: This is where the sample to be examined is placed. It can often be moved in three dimensions to allow different areas of the sample to be examined.
  9. Vibration Isolation Table: Since AFM measurements are extremely sensitive, the whole system is usually placed on a special table to isolate it from external vibrations.
  10. Computer System: A computer is used to control the operation of the AFM, collect the data from the photodetector, and process this data to produce the final image.

In the heart of my professional journey lies a project that not only honed my technical skills but also refined my abilities in various other domains. This project was undertaken during my tenure at [Company Name], where I was tasked with creating an Atomic Force Microscope (AFM) system from scratch. This endeavor was a unique blend of hardware design, software engineering, system integration, FPGA firmware development, and even salesmanship.

The project began with hardware design, where I was responsible for conceptualizing and creating the physical components of the AFM. This process demanded a deep understanding of nanotechnology and the principles behind Atomic Force Microscopy. Each component, from the probe and cantilever to the laser and photodetector, was meticulously designed to ensure optimal performance and precision.

Simultaneously, I was immersed in the world of software design. The AFM required a robust software system to control its operations, collect data, and process this data to produce the final image. This task required a profound knowledge of programming languages and software engineering principles.

The next stage was system integration, where the hardware and software components were brought together to form a cohesive unit. This phase was crucial as it ensured the seamless interaction between all parts of the AFM system.

One of the most challenging aspects of the project was developing the FPGA firmware. This task required a deep understanding of digital circuit design and programming. The FPGA firmware was designed to control the AFM’s operations, ensuring that it functioned efficiently and accurately.

The project also provided me with an opportunity to step into the shoes of a salesperson. I learned how to communicate with potential customers, understand their needs, and present our product in a way that addressed those needs. This process not only improved my communication skills but also provided valuable insights into the market dynamics and customer behavior.

The journey of building an AFM system from zero was an enriching experience that broadened my technical skills and business acumen. It was a testament to the fact that the creation of a product doesn’t end with its physical and digital design; it extends to understanding the market, the customers, and the art of selling. This project was not just about building an AFM; it was about creating a comprehensive solution that meets the needs of the scientific community.

More introduction:https://en.wikipedia.org/wiki/Atomic_force_microscop

System integration on measurement and control system with production
Rich experience on system integration including software, mechanical, date/signal communication, and how to use it on process.
Capable to build up measurement and control system from 0 – ex: building up process tools from concept to migration and combine with control system including all hand-over document and coordinate with process team to provide process guide line.


Team builder. Deputy resource and vendor resource build up for schedule flexibility.
Organization capability to group up team from different function to meet project objective
Group up and scope design change into cross-functional team
Willing to train member to be project leader by guiding them to work on trial & migration project to build up their capability and enable resource’s flexibility
Deputy team build up to meet each project schedule when conflict.


Technology road map build up and strategy on technical migration
Build up process measurement and control technical road map
Capable to identify gap in process issue and deliver technology to fix the gap

  • Key measurement technology migration for process auto control to improve OEE in display
    –Process monitor tool for quality alarm.
    –Edge inspection build up and future process control
    –Defect detection migration for lose prevention.
  • Process understanding and customer-based thinking
    Well understanding on process through multiple join ventures project.
    Capable to design measurement and control system that meet process need.
    in 2020, 3 process control by using gauges has been trial or migrate successfully through coordinating with process

TECHNICAL
SKILLS
LabView
Solidwork 
PLC
C#
CONTACT ME