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Advanced control theory development and paper published in IET control theory and application

AFM(atom force microscope). Capable to measure surface profile in Nano meter (0.000000001mm) An Atomic Force Microscope (AFM) is a complex piece of equipment that consists of several key components: Probe:…

System integration on measurement and control system with productionRich experience on system integration including software, mechanical, date/signal communication, and how to use it on process.Capable to build up measurement and…