AFM(atom force microscope). Capable to measure surface profile in Nano meter (0.000000001mm)
An Atomic Force Microscope (AFM) is a complex piece of equipment that consists of several key components:
- Probe: This is the most crucial part of an AFM. The probe consists of a very sharp tip (often only a few atoms wide) that is attached to a cantilever. The probe is used to scan the surface of the sample.
- Cantilever: The cantilever is a thin beam attached at one end to the probe. When the probe scans the surface of the sample, forces between the atoms cause the cantilever to bend or deflect.
- Laser: A laser beam is directed onto the back of the cantilever. As the cantilever bends or deflects due to the atomic forces, the direction of the reflected laser beam changes.
- Photodetector: This component detects the changes in the direction of the reflected laser beam. The photodetector is divided into four quadrants, and the difference in light intensity between these quadrants allows the deflection of the cantilever to be measured.
- XYZ Piezoelectric Scanner: This component moves the sample (or sometimes the probe) in the X, Y, and Z directions with extreme precision, allowing the probe to scan the surface of the sample.
- Feedback Loop: This electronic system controls the height of the scanner (or the probe) to maintain constant force between the probe and the sample, or constant deflection of the cantilever.
- Controller: This is the ‘brain’ of the AFM. It processes the signals from the photodetector and controls the XYZ scanner via the feedback loop.
- Sample Stage: This is where the sample to be examined is placed. It can often be moved in three dimensions to allow different areas of the sample to be examined.
- Vibration Isolation Table: Since AFM measurements are extremely sensitive, the whole system is usually placed on a special table to isolate it from external vibrations.
- Computer System: A computer is used to control the operation of the AFM, collect the data from the photodetector, and process this data to produce the final image.
In the heart of my professional journey lies a project that not only honed my technical skills but also refined my abilities in various other domains. This project was undertaken during my tenure at [Company Name], where I was tasked with creating an Atomic Force Microscope (AFM) system from scratch. This endeavor was a unique blend of hardware design, software engineering, system integration, FPGA firmware development, and even salesmanship.
The project began with hardware design, where I was responsible for conceptualizing and creating the physical components of the AFM. This process demanded a deep understanding of nanotechnology and the principles behind Atomic Force Microscopy. Each component, from the probe and cantilever to the laser and photodetector, was meticulously designed to ensure optimal performance and precision.
Simultaneously, I was immersed in the world of software design. The AFM required a robust software system to control its operations, collect data, and process this data to produce the final image. This task required a profound knowledge of programming languages and software engineering principles.
The next stage was system integration, where the hardware and software components were brought together to form a cohesive unit. This phase was crucial as it ensured the seamless interaction between all parts of the AFM system.
One of the most challenging aspects of the project was developing the FPGA firmware. This task required a deep understanding of digital circuit design and programming. The FPGA firmware was designed to control the AFM’s operations, ensuring that it functioned efficiently and accurately.
The project also provided me with an opportunity to step into the shoes of a salesperson. I learned how to communicate with potential customers, understand their needs, and present our product in a way that addressed those needs. This process not only improved my communication skills but also provided valuable insights into the market dynamics and customer behavior.
The journey of building an AFM system from zero was an enriching experience that broadened my technical skills and business acumen. It was a testament to the fact that the creation of a product doesn’t end with its physical and digital design; it extends to understanding the market, the customers, and the art of selling. This project was not just about building an AFM; it was about creating a comprehensive solution that meets the needs of the scientific community.
More introduction:https://en.wikipedia.org/wiki/Atomic_force_microscop
